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[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Physical failure analysis to distinguish EOS and ESD failures

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - Physical failure analysis to distinguish EOS and ESD failures

Tung Chih Hang, ; Cheng Cheng Kou, ; Radhakrishnan, M.K.; Iyer, N.M.

作者Tung Chih Hang, ; Cheng Cheng Kou, ; Radhakrishnan, M.K.; Iyer, N.M.
文件大小1305.14KB
发表时间2002
DOI10.1109/IPFA.2002.1025613
页码65-69

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