发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Spectroscopic analysis of trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments

[IEEE IEEE International Electron Devices Meeting - San Francisco, CA, USA (8-11 Dec. 2002)] Digest. International Electron Devices Meeting, - Spectroscopic analysis of trap assisted tunneling in thin oxides by means of substrate hot electron injection experiments

Driussi, F.; Iob, R.; Esseni, D.; Selmi, L.; van Schaijk, R.; Widdershoven, F.
  • 作者Driussi, F.; Iob, R.; Esseni, D.; Selmi, L.; van Schaijk, R.; Widdershoven, F.
  • 文件大小275.83KB
  • 发表时间2002
  • DOI10.1109/iedm.2002.1175803
  • 页码159-162
同标题推荐
同期刊推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯