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[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Generation activity and crystal defects in semiconductor devices

[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Generation activity and crystal defects in semiconductor devices

Rybchenkov, A.A.; Davydov, V.N.
  • 作者Rybchenkov, A.A.; Davydov, V.N.
  • 文件大小231.32KB
  • 发表时间2002
  • DOI10.1109/sibedm.2002.998046
  • 页码9-12
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