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[IEEE Proceedings of 39th Design Automation Conference - New Orleans, LA, USA (2002.6.10-2002.6.14)] Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) - Enhancing test efficiency for delay fault testing using multiple-clocked schemes

[IEEE Proceedings of 39th Design Automation Conference - New Orleans, LA, USA (2002.6.10-2002.6.14)] Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) - Enhancing test efficiency for delay fault testing using multiple-clocked schemes

Jing-Jia Liou, ; Wang, L.-C.; Kwang-Ting Cheng,

作者Jing-Jia Liou, ; Wang, L.-C.; Kwang-Ting Cheng,
文件大小488.22KB
发表时间2002
DOI10.1109/dac.2002.1012652
页码371-374

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