Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || Atomic Force Microscopy—A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy
- 作者Cohen, Samuel H.; Lightbody, Marcia L.
- 文件大小215.94KB
- 发表时间2002
- DOI10.1007/0-306-47095-0_20
- 页码205-208
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