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[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - Application of guard traces with vias in the RF PCB layout

[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - Application of guard traces with vias in the RF PCB layout

Li Zhi, ; Wang Qiang, ; Shi Changsheng,

作者Li Zhi, ; Wang Qiang, ; Shi Changsheng,
文件大小171.33KB
发表时间2002
DOI10.1109/elmagc.2002.1177544
页码771-774

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