High-performance fully-depleted SOI RF CMOS

Chen, C.L.; Spector, S.J.; Blumgold, R.M.; Neidhard, R.A.; Beard, W.T.; Yost, D.-R.; Knecht, J.M.; Chen, C.K.; Fritze, M.; Cerny, C.L.; Cook, J.A.; Wyatt, P.W.; Keast, C.L.

期刊名称IEEE Electron Device Letters
作者Chen, C.L.; Spector, S.J.; Blumgold, R.M.; Neidhard, R.A.; Beard, W.T.; Yost, D.-R.; Knecht, J.M.; Chen, C.K.; Fritze, M.; Cerny, C.L.; Cook, J.A.; Wyatt, P.W.; Keast, C.L.
卷第23卷
期第1期
印刷ISSN0741-3106
电子ISSN1558-0563
文件大小71.44KB
发表时间2002-01
DOI10.1109/55.974810
页码52-54

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High-performance fully-depleted SOI RF CMOS