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[IEEE 20th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV'2002) - Tours, France (1-5 July 2002)] 20th International Symposium on Discharges and Electrical Insulation in Vacuum - The electrostatic breakdown on a metal-dielectric junction immersed in a plasma

[IEEE 20th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV'2002) - Tours, France (1-5 July 2002)] 20th International Symposium on Discharges and Electrical Insulation in Vacuum - The electrostatic breakdown on a metal-dielectric junction immersed in a plasma

Vayner, B.V.; Galofaro, J.T.; Ferguson, D.C.

作者Vayner, B.V.; Galofaro, J.T.; Ferguson, D.C.
文件大小260.09KB
发表时间2002
DOI10.1109/isdeiv.2002.1027314
页码80-83

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