[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Software and hardware for measurements systems
Zaborovsky, A.N.; Danilov, D.O.; Leonov, G.V.; Mescheriakov, R.V.
- 作者Zaborovsky, A.N.; Danilov, D.O.; Leonov, G.V.; Mescheriakov, R.V.
- 文件大小215.25KB
- 发表时间2002
- DOI10.1109/sibedm.2002.998064
- 页码53-57