SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Polarization Analysis and Measurement IV - Near-infrared imaging polarimetry
Goldstein, Dennis H.; Chenault, David B.; Gulley, Michael G.; Spradley, Kevin D.; Goldstein, Dennis H.; Chenault, David B.; Egan, Walter G.; Duggin, Michael J.
- 作者Goldstein, Dennis H.; Chenault, David B.; Gulley, Michael G.; Spradley, Kevin D.; Goldstein, Dennis H.; Chenault, David B.; Egan, Walter G.; Duggin, Michael J.
- 卷第4481卷
- 印刷ISSN0277-786X
- 文件大小1243.62KB
- 发表时间2002
- DOI10.1117/12.452878
- 页码100-108