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The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake

The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake

Lee, Min-Hung; Chen, Kuan-Fu; Lai, Chang-Chi; Liu, Chee Wee; Pai, Woei-Wu; Chen, Miin-Jang; Lin, Ching-Fuh
  • 期刊名称Japanese Journal of Applied Physics
  • 作者Lee, Min-Hung; Chen, Kuan-Fu; Lai, Chang-Chi; Liu, Chee Wee; Pai, Woei-Wu; Chen, Miin-Jang; Lin, Ching-Fuh
  • 卷第41卷
  • 印刷ISSN0021-4922
  • 文件大小65.93KB
  • 发表时间2002-3-15
  • DOI10.1143/jjap.41.l326
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