SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Optical Design and Testing - Total performance measurement of infrared thermal imager
- 作者Wang, Yuefeng; Zhou, LiWei; Huang, Feng; Zhang, Wei; Weng, Zhicheng; Sasian, Jose M.; Wang, Yongtian
- 卷第4927卷
- 印刷ISSN0277-786X
- 文件大小334.96KB
- 发表时间2002
- DOI10.1117/12.471684
- 页码644-651