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Thickness dependence of irreversibility field in Bi-2212 thin films

Thickness dependence of irreversibility field in Bi-2212 thin films

H Wada; E.S Otabe; T Matsushita; T Yasuda; T Uchiyama; I Iguchi; Z Wang

作者H Wada; E.S Otabe; T Matsushita; T Yasuda; T Uchiyama; I Iguchi; Z Wang
印刷ISSN0921-4534
文件大小127.13KB
发表时间2002
DOI10.1016/s0921-4534(02)01498-3
页码570-574

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