Utilizing the SIMS technique in the study of grain boundary diffusion along twist grain boundaries in the Cu(Ni) system

• 作者S.M. Schwarz; B.W. Kempshall; L.A. Giannuzzi; F.A. Stevie
• 卷第50卷
• 期第20期
• 印刷ISSN1359-6454
• 文件大小109.95KB
• 发表时间2002
• DOI10.1016/s1359-6454(02)00362-2
• 页码5079-5084