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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Physics and Simulation of Optoelectronic Devices X - <title>Simulation of hot-electron effect in negative-electron-affinity GaN pn junction diodes</title>

SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Physics and Simulation of Optoelectronic Devices X - Simulation of hot-electron effect in negative-electron-affinity GaN pn junction diodes

Fardi, Hamid Z.; Alaghband, Gita; Blood, Peter; Osinski, Marek; Arakawa, Yasuhiko
  • 作者Fardi, Hamid Z.; Alaghband, Gita; Blood, Peter; Osinski, Marek; Arakawa, Yasuhiko
  • 卷第4646卷
  • 印刷ISSN0277-786X
  • 文件大小179.29KB
  • 发表时间2002
  • DOI10.1117/12.470563
  • 页码574-582
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