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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - <title>Polarization measurements of the extreme ultraviolet (EUV) emission following excitation and ionization-excitation of helium by fast electron, proton, and molecular hydrogen (H<formula><inf><roman>2</roman></inf></formula>+ and H<formula><inf><roman>3</roman></inf></formula>+) impact</title>

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] Polarization Measurement, Analysis, and Applications V - Polarization measurements of the extreme ultraviolet (EUV) emission following excitation and ionization-excitation of helium by fast electron, proton, and molecular hydrogen (H<formula><inf><roman>2</roman></inf></formula>+ and H<formula><inf><roman>3</roman></inf></formula>+) impact

Merabet, Hocine; Bruch, Reinhard F.; Fuelling, Stephan; Bartschat, K.; Godunov, Alexander; McGuire, James H.; Grum-Grzhimailo, A. N.; Goldstein, Dennis H.; Chenault, David B.
  • 作者Merabet, Hocine; Bruch, Reinhard F.; Fuelling, Stephan; Bartschat, K.; Godunov, Alexander; McGuire, James H.; Grum-Grzhimailo, A. N.; Goldstein, Dennis H.; Chenault, David B.
  • 卷第4819卷
  • 印刷ISSN0277-786X
  • 文件大小171.04KB
  • 发表时间2002
  • DOI10.1117/12.450401
  • 页码118-128
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