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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Photodetector Materials and Devices VII - <title>Noninvasive electrical characterization of semiconductor and interface</title>

SPIE Proceedings [SPIE Symposium on Integrated Optoelectronic Devices - San Jose, CA (Friday 18 January 2002)] Photodetector Materials and Devices VII - Noninvasive electrical characterization of semiconductor and interface

Kasouit, Samir; Drevillon, Bernard; Conde, Joao; Kim, Hyun Jong; Kleider, Jean Paul; Vanderhaghen, Regis; Brown, Gail J.; Razeghi, Manijeh
  • 作者Kasouit, Samir; Drevillon, Bernard; Conde, Joao; Kim, Hyun Jong; Kleider, Jean Paul; Vanderhaghen, Regis; Brown, Gail J.; Razeghi, Manijeh
  • 卷第4650卷
  • 印刷ISSN0277-786X
  • 文件大小90.65KB
  • 发表时间2002
  • DOI10.1117/12.467666
  • 页码213-220
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