Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Rutile Thin Film.
- 期刊名称Journal of the Ceramic Society of Japan
- 作者SUZUKI, Toshimasa; WAKABAYASHI, Hirotaka; NISHI, Yuji; FUJIMOTO, Masayuki
- 卷第110卷
- 期第1278期
- 印刷ISSN0914-5400
- 电子ISSN1882-1022
- 文件大小4483.97KB
- 发表时间2002
- DOI10.2109/jcersj.110.86
- 页码86-91
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