Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || A Prectical Approach to Understanding Surface Metrology and Its Applications
- 作者Cohen, Samuel H.; Lightbody, Marcia L.
- 文件大小96.16KB
- 发表时间2002
- DOI10.1007/0-306-47095-0_1
- 页码1-10
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