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Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip

Atomic Force Microscopy/Scanning Tunneling Microscopy 3 || A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip

Cohen, Samuel H.; Lightbody, Marcia L.

作者Cohen, Samuel H.; Lightbody, Marcia L.
文件大小135.78KB
发表时间2002
DOI10.1007/0-306-47095-0_8
页码87-95

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