TEM Observation on Single Defect in SiC
- 期刊名称Microscopy and Microanalysis
- 作者Liu, J. Q.; Skowronski, M.; Neudeck, P. G.; Powell, J. A.
- 卷第8卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小123.10KB
- 发表时间2002-08
- DOI10.1017/s143192760210777x
- 页码1180-1181
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