On Selecting Testable Paths in Scan Designs
Yun Shao; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara
- 作者Yun Shao; Sudhakar M. Reddy; Irith Pomeranz; Seiji Kajihara
- 卷第19卷
- 期第4期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小94.30KB
- 发表时间2003-08
- DOI10.1023/a:1024648227669
- 页码447-456