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A versatile atomic number correction for electron-probe microanalysisLove, G; Cox, M G; Scott, V D · Journal of Physics D: Applied Physics · 1978
Assessment of Bishop's absorption correction model in electron probe microanalysisLove, G; Cox, M G C; Scott, V D · Journal of Physics D: Applied Physics · 1976
Electron probe microanalysis using oxygen x-rays: I. Mass absorption coefficientsLove, G; Cox, M G C; Scott, V D · Journal of Physics D: Applied Physics · 1974
A simple Monte Carlo method for simulating electron-solid interactions and its application to electron probe microanalysisLove, G; Cox, M G C; Scott, V D · Journal of Physics D: Applied Physics · 1977
BHPR: Audit/Service Delivery [239-277]: 239. Arma-Based Audit of Rheumatology Service Delivered Predominantly Outside the Traditional Hospital SettingTravers, B.; Henderson, S.; Vasireddy, S.; SeQueira, E. J.; Cornell, P. J.; Richards, S.; Khan, A.; Hasan, S.; Withrington, R.; Leak, A.; Sandhu, J.; Joseph, A.; Packham, J. C.; Lyle, S.; Martin, J. C.; Goodfellow, R. M.; Rhys-Dillon, C.; Morgan, J. T.; Mogford, S.; Rowan-Phillips, J.; Moss, D.; Wilson, H.; McEntegart, A.; Morgan, J. T.; Martin, J. C.; Rhys Dillon, C.; Goodfellow, R.; Gould, L.; Bukhari, M.; Hassan, S.; Butt, S.; Deighton, C.; Gadsby, K.; Love, V.; Kara, N.; Gohery, M.; Keat, A.; Lewis, A.; Robinson, R.; Bastawrous, S.; Roychowdhury, B.; Roskell, S.; Douglas, B.; Keating, H.; Giles, S.; McPeake, J.; Molloy, C.; Chalam, V.; Mulherin, D.; Price, T.; Sheeran, T.; Benjamin, S. R.; Thompson, P. W.; Cornell, P.; Siddle, H. J.; Backhouse, M. R.; Monkhouse, R. A.; Harris, N. J.; Helliwell, P. S.; Azzopardi, L.; Hudson, S.; Mallia, C.; Cassar, K.; Coleiro, B.; Cassar, P. J.; Aquilina, D.; Camilleri, F.; Serracino Inglott, A.; Azzopardi, L. M.; Robinson, S.; Peta, H.; Margot, L.; David, W.; Mann, C.; Gooberman-Hill, R.; Jagannath, D.; Healey, E.; Goddard, C.; Pugh, M. T.; Gilham, L.; Bawa, S.; Barlow, J. H.; MacFarland, L.; Tindall, L.; Leddington Wright, S.; Tooby, J.; Ravindran, J.; Perkins, P.; McGregor, L.; Mabon, E.; Bawa, S.; Bond, U.; Swan, J.; O'Connor, M. B.; Rathi, J.; Regan, M. J.; Phelan, M. J.; Doherty, T.; Martin, K.; Ruth, C.; Panthakalam, S.; Bondin, D.; Castelino, M.; Evin, S.; Gooden, A.; Peacock, C.; Teh, L.-S.; Ryan, S.-J.; Bryant, E.; Carter, A.; Cox, S.; Moore, A. P.; Jackson, A.; Kuisma, R.; Pattman, J.; Juarez, M.; Quilter, A.; Williamson, L.; Collins, D.; Price, E.; Chao, Y.; Mooney, J.; Watts, R.; Graham, K.; Birrell, F.; Reed, M.; Croyle, S.; Stell, J.; Vasireddy, S.; Storrs, P.; McLoughlin, Y.-m.; Scott, G.; McKenna, F.; Papou, A.; Rahmeh, F. H.; Richards, S. C.; Westlake, S. L.; Birrell, F.; Morgan, L.; Baqir, W.; Walsh, N. E.; Ward, L.; Caine, R.; Williams, M.; Breslin, A.; Owen, C.; Ahmad, Y.; Morgan, L.; Blair, A.; Birrell, F. · Rheumatology · 2010
Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988
Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006
Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000
Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000
Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008
Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008
Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005
Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013