Scanning Electron Microscopy and X-ray Microanalysis || Special Topics in Scanning Electron Microscopy
Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R.
- 作者Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, David C.; Lyman, Charles E.; Lifshin, Eric; Sawyer, Linda; Michael, Joseph R.
- 文件大小4334.13KB
- 发表时间2003
- DOI10.1007/978-1-4615-0215-9_5
- 页码195-270