Book Reviews
- 期刊名称International Peacekeeping
- 作者Davidson, Scott; Drifte, Reinhard; Gallavin, Chris; Kirby, Dianne; Turack, Daniel C.
- 卷第10卷
- 期第3期
- 印刷ISSN1353-3312
- 电子ISSN1743-906X
- 文件大小685.98KB
- 发表时间2003-08
- DOI10.1080/13533310308559342
- 页码150-160
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - 2004 PROCEEDINGS, Twentieth IEEE Semiconductor Thermal Measurement and Management Symposium - copywright2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - WelcomeMack, B. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Camera for thermal imaging of semiconductor devices based on thermoreflectanceChristofferson, J.; Shakouri, A. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Temperature measurements of semiconductor devices - a reviewBlackburn, D.L. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Hierarchical thermal modeling for SOI technologyXiu, K.; Ketchen, M. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Thermal management of harsh-environment electronicsOhadi, M.; Jianwei Qi, · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - Table of contents2004