[IEEE Comput. Soc 8th IEEE European Test Workshop (ETW 03) - Maastricht, Netherlands (25-28 May 2003)] The Eighth IEEE European Test Workshop, 2003. Proceedings. - On the selection of efficient arithmetic additive test pattern generators [logic test]
- 作者Manich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J.
- 文件大小264.02KB
- 发表时间2003
- DOI10.1109/etw.2003.1231662
- 页码9-14
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