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[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Logistic modeling of progressive breakdown in ultrathin gate oxides

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Logistic modeling of progressive breakdown in ultrathin gate oxides

Miranda, E.; Bandiera, L.; Cester, A.; Paccagnella, A.

作者Miranda, E.; Bandiera, L.; Cester, A.; Paccagnella, A.
文件大小240.57KB
发表时间2003
DOI10.1109/essderc.2003.1256816
页码83-86

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