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[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Recent progress in compact thermal models

[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Recent progress in compact thermal models

Lasance, C.J.M.

作者Lasance, C.J.M.
文件大小743.01KB
发表时间2003
DOI10.1109/stherm.2003.1194376
页码290-299

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