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[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Electrical characterisation of high voltage MOSFETs using MESDRIFT

[IEEE Oper. Center 2003 International Semiconductor Conference. CAS 2003 - Sinaia, Romania (28 Sept.-2 Oct. 2003)] 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676) - Electrical characterisation of high voltage MOSFETs using MESDRIFT

Anghel, C.; Hefyene, N.; Vermandel, M.; Bakeroot, B.; Doutreloigne, J.; Gillon, R.; Ionescu, A.M.
  • 作者Anghel, C.; Hefyene, N.; Vermandel, M.; Bakeroot, B.; Doutreloigne, J.; Gillon, R.; Ionescu, A.M.
  • 文件大小240.77KB
  • 发表时间2003
  • DOI10.1109/smicnd.2003.1252430
  • 页码257-260
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