[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Reliability prediction for TFBGA assemblies
- 作者Radivojevic, Z.; Abdul-Quadir, Y.; Myllykoski, P.; Rantala, J.
- 文件大小438.45KB
- 发表时间2003
- DOI10.1109/stherm.2003.1194382
- 页码336-340
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