[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - SOC test scheduling using simulated annealing
Wei Zou, ; Reddy, S.M.; Pomeranz, I.; Yu Huang,
- 作者Wei Zou, ; Reddy, S.M.; Pomeranz, I.; Yu Huang,
- 文件大小730.07KB
- 发表时间2003
- DOI10.1109/vtest.2003.1197670
- 页码325-330