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[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Non-linearity issues in the dynamic compact model generation [package thermal modeling]

[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Non-linearity issues in the dynamic compact model generation [package thermal modeling]

Rencz, M.; Szekely, V.

作者Rencz, M.; Szekely, V.
文件大小453.87KB
发表时间2003
DOI10.1109/stherm.2003.1194372
页码263-270

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