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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Test resource partitioning and optimization for SOC designs

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Test resource partitioning and optimization for SOC designs

Larsson, E.; Fujiwara, H.

作者Larsson, E.; Fujiwara, H.
文件大小282.81KB
发表时间2003
DOI10.1109/vtest.2003.1197669
页码319-324

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