[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Emission characteristics of NbC/Nb field emitters
- 作者Charbonnier, F.; Southall, L.; Mackie, A.
- 文件大小125.68KB
- 发表时间2003
- DOI10.1109/ivmc.2003.1222946
- 页码5-6
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