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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Fault testing for reversible circuits

[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Fault testing for reversible circuits

Patel, K.N.; Hayes, J.P.; Markov, I.L.

作者Patel, K.N.; Hayes, J.P.; Markov, I.L.
文件大小364.72KB
发表时间2003
DOI10.1109/vtest.2003.1197682
页码410-416

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