Influence of the polarization on interfacial properties in Al/SiO[sub 2]/GaN/Al[sub 0.4]Ga[sub 0.6]N/GaN heterojunction metal–insulator–semiconductor structures
Chen, P.; Chua, S. J.; Wang, W. D.; Chi, D. Z.; Miao, Z. L.; Zheng, Y. D.
- 期刊名称Journal of Applied Physics
- 作者Chen, P.; Chua, S. J.; Wang, W. D.; Chi, D. Z.; Miao, Z. L.; Zheng, Y. D.
- 卷第94卷
- 期第7期
- 印刷ISSN0021-8979
- 文件大小282.44KB
- 发表时间2003
- DOI10.1063/1.1599046