Scanning transmission electron microscopy study of Au/Zn/Au/Cr/Au and Au/Ti/Pt/Au/Cr/Au contacts to p-type InGaAs/InP

• 期刊名称Journal of Applied Physics
• 作者Huang, J. S.; Vartuli, C. B.
• 卷第93卷
• 期第9期
• 印刷ISSN0021-8979
• 文件大小1424.35KB
• 发表时间2003
• DOI10.1063/1.1565187