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[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Field emission characteristics of defect-controlled polyimide tunneling cathode

[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Field emission characteristics of defect-controlled polyimide tunneling cathode

Baba, A.; Yoshida, T.; Asano, T.
  • 作者Baba, A.; Yoshida, T.; Asano, T.
  • 文件大小127.91KB
  • 发表时间2003
  • DOI10.1109/ivmc.2003.1223086
  • 页码267-268
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