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[ACM Press the 40th conference - Anaheim, CA, USA (2003.06.02-2003.06.06)] Proceedings of the 40th conference on Design automation - DAC '03 - New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements

[ACM Press the 40th conference - Anaheim, CA, USA (2003.06.02-2003.06.06)] Proceedings of the 40th conference on Design automation - DAC '03 - New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements

Root, David E.; Wood, John; Tufillaro, Nick

作者Root, David E.; Wood, John; Tufillaro, Nick
文件大小329.41KB
发表时间2003
DOI10.1145/775832.775856

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