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$Silicon carbide surface structure investigated by synchrotron radiation-based x-ray diffraction$

Silicon carbide surface structure investigated by synchrotron radiation-based x-ray diffraction

H. Enriquez; M. D’angelo; V. Y. Aristov; V. Derycke; P. Soukiassian; G. Renaud; A. Barbier; S. Chiang; F. Semond

作者H. Enriquez; M. D’angelo; V. Y. Aristov; V. Derycke; P. Soukiassian; G. Renaud; A. Barbier; S. Chiang; F. Semond
文件大小630.43KB
发表时间2003
DOI10.1116/1.1588650

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