Inelastic electron scattering observation using energy filtered transmission electron microscopy for silicon–germanium nanostructures imaging

• 作者R Pantel; S Jullian; D Delille; D Dutartre; A Chantre; O Kermarrec; Y Campidelli; L.F.T.Z Kwakman
• 卷第34卷
• 印刷ISSN0968-4328
• 文件大小694.99KB
• 发表时间2003
• DOI10.1016/s0968-4328(03)00034-9
• 页码239-247