SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - Polarization scattering from rough surfaces based on the vector Kirchhoff diffraction model
An, Chang-Hyuk; Zeringue, Kyle J.; Shaw, Joseph A.; Tyo, J. Scott
- 作者An, Chang-Hyuk; Zeringue, Kyle J.; Shaw, Joseph A.; Tyo, J. Scott
- 卷第5158卷
- 印刷ISSN0277-786X
- 文件大小129.36KB
- 发表时间2003
- DOI10.1117/12.504366
- 页码205-216