Reliability analysis of simplex and duplex memory systems with SEC and soft‐error scrubbing recovery
- 期刊名称International Journal of Quality & Reliability Management
- 作者Kontoleon, John M.; Andrianakis, John
- 卷第20卷
- 期第5期
- 印刷ISSN0265-671X
- 文件大小393.27KB
- 发表时间2003-07
- DOI10.1108/02656710310476561
- 页码620-636
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