[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Design and test of a 100MW X-band TE/sub 01/ window
Neilson, J.; Ives, L.; Tantawi, S.G.
- 作者Neilson, J.; Ives, L.; Tantawi, S.G.
- 卷第2卷
- 文件大小78.32KB
- 发表时间2003
- DOI10.1109/pac.2003.1289626
- 页码1125-1126