SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications - X-ray and EUV spectral instruments for plasma source characterization

Shevelko, Alexander P.; Kyrala, George A.; Gauthier, Jean-Claude J.; Kasyanov, Yuri S.; Knight, Larry V.; MacDonald, Carolyn A.; Khounsary, Ali M.; Phillips, James; Turley, R. Steven; Turner, D. Clark; Yakushev, Oleg F.

作者Shevelko, Alexander P.; Kyrala, George A.; Gauthier, Jean-Claude J.; Kasyanov, Yuri S.; Knight, Larry V.; MacDonald, Carolyn A.; Khounsary, Ali M.; Phillips, James; Turley, R. Steven; Turner, D. Clark; Yakushev, Oleg F.
卷第5196卷
印刷ISSN0277-786X
文件大小211.00KB
发表时间2003
DOI10.1117/12.507723

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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications - X-ray and EUV spectral instruments for plasma source characterization