![SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - <title>Toward a 2-eV microcalorimeter x-ray spectrometer for Constellation-X</title>]()
SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - <title>Toward a 2-eV microcalorimeter x-ray spectrometer for Constellation-X</title>Stahle, Caroline K.; Bandler, Simon R.; Barbee, Jr., Troy W.; Beeman, Jeffrey W.; Brekosky, Regis P.; Cabrera, Blas; Cunningham, Mark F.; Deiker, Steven W.; Figueroa-Feliciano, Enectali; Finkbeiner, Fred M.; Frank, Matthias A.; Gendreau, Keith C.; Haller, Eugene E.; Hilton, Gene C.; Irwin, Kent D.; Kelley, Richard L.; Labov, Simon E.; Li, Mary J.; Madden, Norman W.; Martinis, John M.; McCammon, Dan; Nam, Sae Woo; Porter, Frederick S.; Schnopper, Herbert W.; Silver, Eric H.; Szymkowiak, Andrew E.; Tucker, Gregory S.; Walker II, Arthur B. C.; Wollman, D. A.; Siegmund, Oswald H. W.; Flanagan, Kathryn A. · 1999