Accumulation of impurities in advanced scenarios

R. Dux; C. Giroud; R. Neu; A.G. Peeters; J. Stober; K.-D. Zastrow; Contributors to the EFDA-JET Workprogramme

作者R. Dux; C. Giroud; R. Neu; A.G. Peeters; J. Stober; K.-D. Zastrow; Contributors to the EFDA-JET Workprogramme
印刷ISSN0022-3115
文件大小476.25KB
发表时间2003
DOI10.1016/s0022-3115(02)01508-8
页码1150-1155

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