发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

Transmission electron microscopy investigation of the interface formation between silicon and anodic alumina

F. Müller; A.-D. Müller; S. Schulze; M. Hietschold
  • 作者F. Müller; A.-D. Müller; S. Schulze; M. Hietschold
  • 卷第39卷
  • 期第9期
  • 印刷ISSN0022-2461
  • 电子ISSN1573-4803
  • 文件大小155.38KB
  • 发表时间2004-05-1
  • DOI10.1023/b:jmsc.0000025858.30792.bf
  • 页码3199-3200
← 返回【学霸图书馆】主页