![SPIE Proceedings [SPIE Third Conference on Sensors, MEMS and Electro-Optic Systems - Skukuza, Kruger National Park, South Africa (Sunday 16 March 2014)] Sensors, MEMS and Electro-Optical Systems - Fine-correlation: inter-sample template matching]()
SPIE Proceedings [SPIE Third Conference on Sensors, MEMS and Electro-Optic Systems - Skukuza, Kruger National Park, South Africa (Sunday 16 March 2014)] Sensors, MEMS and Electro-Optical Systems - Fine-correlation: inter-sample template matchingdu Plessis, Monuko; Reyneke, Pieter V.; van der Berg, Etienne S.; de Ridder, Corné · 2014