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[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - SRAM SER in 90, 130 and 180 nm bulk and SOI technologies

Cannon, E.H.; Reinhardt, D.D.; Gordon, M.S.; Makowenskyj, P.S.

作者Cannon, E.H.; Reinhardt, D.D.; Gordon, M.S.; Makowenskyj, P.S.
文件大小359.68KB
发表时间2004
DOI10.1109/relphy.2004.1315341
页码300-304

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